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MicroAnalytical
Facility
John Donovan |
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Links to Instrument Calendars |
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primary goal of the CAMCOR MicroAnalytical Facility
is to provide high accuracy microscale quantitative
measurements for both chemical composition and physical
structure on a variety of materials. The MicroAnalytical
facility provides resources for sample preparation
and materials analysis by scanning electron microscopy
and electron microprobe analysis.
MicroAnalytical
Facility Brochure (PDF) |
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MicroAnalytical
Cameca Sx50 EPMA
Cameca SX100 EPMA
FEI Quanta ESEM |
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Surface
Analytical Laboratory
Dr. Stephen
Golledge |
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CAMCOR Surface Analytical facility houses instrumentation
for characterizing the composition of the outermost
few nanometers of materials, and for imaging surface
topography and chemistry. Presently the main techniques
available are X-Ray Photoelectron Spectroscopy (XPS),
Ultraviolet Photoelectron Spectroscopy (UPS), and
Atomic Force Microscopy (AFM). A time-of-flight
SIMS with a polyatomic Au source and depth profiling
capability has been ordered and is scheduled to
arrive in Spring of 2004.
Surface
Analytical Lab Brochure (PDF) |
Surface Analytical
Ion_TOF TOF-SIMS
Phi XPS
Philips Auger
Waters QTOF
AFM
SNOM
Ellipsometer
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Alice C. Tyler Nanofabrication and Imaging Facility
Kurt Langworthy |
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The
CAMCOR Alice C. Tyler Nanofabrication and Imaging Facility provides microscopy
applications and techniques from the light level to
electron microscopy. The facility provides photographic
services, light microscopy, transmission electron microscope/with
cryo capabilities, and a multiphoton scanning laser
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Nanofabrication
Zeiss Ultra SEM
FEI Helios
High Resolution
FEI Titan 1
FEI Titan 2
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X-Ray Diffraction Lab
Dr. Lev Zakharov
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TBA |
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X-ray Diffraction
Bruker D8 Discover XRD
Philips Panalytical XRD
Scintag 1
Scintag 2
Bruker Apex
Rigaku SCXMini |
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Semiconductor and Characterization Labs
Prof. Mark Lonergan |
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The
Semiconductor and Characterization Labs provide
facilities for making and studying semiconductor device
physics and chemistry. The laboratories house photolithography,
high-vacuum deposition, and other semiconductor device
processing equipment as well as instrumentation for
the electrical characterization of materials and devices. |
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Chemical
Research Instrumentation Services
Prof. Darren
Johnson
Dr. Michael
Strain (NMR facility) |
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CRIS
houses state of the art instrumentation for traditional
molecular characterization. Available
instrumentation includes a 300 and 500 MHz NMR, FTIR,
Mass Spec, UV-Vis, EPR, and a new
SMART APEX X-ray diffractometer system with
CCD area detector.
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