CAMCOR Workshops               The CAMCOR facilities periodically offer short courses and workshops to teach current and future users about the specific instrumentation technique, data collection and analysis as well as training on sample preparation. Summarized below are some of the past workshops, as well as some of the planned future workshops. To inquire about more information please contact the director of the facility directly.                       Future Workshops:                   •                           •                         Past workshops:                 • EDS Spectrum Imaging and Low Voltage (High Resolution) Analysis         3-day workshop by Dale Newbury (NIST) September 12-14, 2006               • First Annual CAMCOR Short Course Series on Surface Analysis Methods and Data Reduction           Portland, OR June 26-30, 2006               • Electron Microscopy     • • • A 2 day confocal workshop with instructors Dr. Bob Price, University of South Carolina and Dr. Jay Jerome, Vanderbilt University; Dec 2002 A tri-pod polishing workshop with instructor Ron Anderson from IBM; Nov 2002 A FIB workshop with instructor Bobby Hooghan from Agere, Allentown PA; Fall 2003           • Microanalytical Facility John Donovan       • EPMA Fall Workshop, Sept. 2003. A 3 day workshop on issues related to problems in attaining high accuracy for microscale chemistry for geological materials and thin films. The primary invited speaker was John Armstrong of NIST (National Institute of Standards and Technology)