Data Processing in XPS/ESCA and AES (1 day)
		XPS and AES are used to determine the atoms present at a surface, and their concentrations, chemistries, and lateral and depth distributions. This course will show attendees how to process and evaluate XPS and AES spectra:
				•	Spectra ö the many features present in spectra will be described.
				•	Background subtraction methods will be described and compared.
				•	Shapes of peaks will be described and approaches for curve fitting will be illustrated.
				•	Approaches for quantitative analysis will be demonstrated and errors illustrated.
				•	Data processing methods to improve images will be demonstrated.
				•	Data processing methods for near-surface, non-destructive depth profiling will be illustrated.
				•	Data processing methods to remove peak overlap problems, separate different chemical states, and improve signal-to-noise in sputter depth profiles will be demonstrated.
				•	Spectra ö the many features present in spectra will be described.
		Hours: 8:30 am-5pm, Lunch on your own
		Printed notes will be provided to participants