MicroAnalytical Facility John Donovan 
 
 
 
 
    Scanning Electron Microscopy (SEM)
   
 
   
  Left - WSe2 thin film annealed and recrystallized, BSE composition, 15 kev, 400X
  Right - ZnO-SnO2 sputter target, BSE topographic/composition, 15 kev, 400X
 
  SEM Provides:
   
  •
 The scanning electron microscope focuses an electron beam while it is scanned across a sample's surface.
• Secondary electrons emitted from the atoms on the top surface are used to construct quantitative 3 dimensional elevation models of complex surfaces, for example porous materials or fracture surfaces.
• Backscattered electrons are used to show the distribution of different chemical phases in the sample.
• Qualitative or quantitative elemental analysis at microscale can be achieved with Energy Dispersive X-ray Spectroscopy (EDS). X-rays may also be used to form maps or line profiles, showing the elemental distribution in a sample surface.
• Cathodo-luminescence emission is the result of band gap excitation in insulating and semi-conductor materials generally on the order of a few electron volts, and can produce visible light emission. These emissions are often correlated with trace elements and also lattice defects and/or crystallographic stresses.
   
Typical Applications:
 

Electron beam lithography, polycrystalline textures and orientation, nanotechnology, palentology ,anthropology, igneous petrology