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| Surface
Analytical Laboratory Dr.
Stephen Golledge
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The
CAMCOR Surface Analytical facility houses instrumentation for characterizing
the composition of the outermost few nanometers of materials, and
for imaging surface topography and chemistry. |
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| Instrumentation
includes: |
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Kratos
Hsi monochromatized X-ray Photoelectron Spectrometer (XPS) with UPS source
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ION
Time-of-Flight Secondary Ion Mass Spectrometry (Tof-SIMS) with polyatomic
Au source and depth profiling capability |
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Nanoscope
IIIa Atomic Force Microscopy (AFM) |
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Woollam
M44 spectroscopic ellipsometer |
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Phi
Model 670 Scanning Auger Microscope |
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