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(e.g. monomeric components and repeat units)
several thousand Å into the sample
| Surface Analytical Laboratory Dr. Stephen Golledge | ||||||||||||||||
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Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) | |||||||||||||||
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| ToF-SIMS provides: | ||||||||||||||||
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A mass spectrum of the outermost 12Å of a surface | |||||||||||||||
| • | Identification
of structural units present at the surface (e.g. monomeric components and repeat units) |
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| • | Fingerprint identification of polymers | |||||||||||||||
| • | Information on surface degradation and contamination | |||||||||||||||
| • | Spatial imaging of the surface chemistry | |||||||||||||||
| • | A full mass spectrum from every pixel of an image | |||||||||||||||
| • | High mass resolution | |||||||||||||||
| • | Extremely high analytical sensitivity | |||||||||||||||
| • | Destructive
elemental depth profiles several thousand Å into the sample |
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| Graphical Examples of Data Obtained: | ||||||||||||||||
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Mass Spectrum | |||||||||||||||
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Chemical Map I | |||||||||||||||
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Chemical Map II | |||||||||||||||
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Depth Profile | |||||||||||||||