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| Surface
Analytical Laboratory Dr.
Stephen Golledge
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X-Ray
Photoelectron Spectroscopy (XPS) |
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XPS
provides: |
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Identification
of all elements (except H and He) present in the outermost 100Å of
a surface in concentrations > 0.1 atomic % |
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Determination
of the elemental surface composition (±10%) |
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Information
on lateral variation in composition (resolution ˜ 150µm) |
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Information
about the molecular environment (oxidation state, bonding atoms, etc.) |
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Also
known as Electron Spectroscopy for Chemical Analysis (ESCA) |
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| Applications: |
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Identification
of organic groups using derivatization |
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Nondestructive
elemental depth profiles |
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Destructive
elemental depth profiles several thousand Å into the sample |
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Variable
temperature analysis |
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| Graphical
Examples of Data Obtained: |
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Survey
Spectrum |
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Depth
Profile |
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Chemical
State |
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